Literature NXP Problem

 

 

1.

ESD - RF Technology and Circuits, Steven H. Voldman, Vermont, USA

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2.

Electrostatic Discharge Protection in the Nano-Technology Will We be able to Provide ESD Protection in the Future? Steven H. Voldman, IEEE Fellow

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3.

Electrostatic Discharge in Semiconductor, Devices: An Overview, James E. Vinsons and Juin J. Liou, Senior Member IEEE

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4.

Fowler Nordheim Equations

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5.

IEEE break down empirical law

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6.

Reliability issues in rf-mems switches submitted to cycling and ESD test

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7.

Electrical breakdown and ESD phenomena for devices with nanometer-to-micron gaps, Al Wallash and Larry Levit

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